SPICE simulation of thermal reset transitions in Ni/HfO2/Si-n+ RRAMs including quantum effects

January 2, 2017January 15, 2017Gerardo Gonzalez

G. González-Cordero, F. Jimenez-Molinos, M. A. Villena and J. B. Roldán, “SPICE simulation of thermal reset transitions in Ni/HfO2/Si-n+ RRAMs including quantum effects,” in 19th Workshop on Dielectrics in Microelectronics (Wodim), 2016 in Catania, Italy.

RRAM Modeling

Department of Electronics and Computer Technology. University of Granada

SPICE simulation of thermal reset transitions in Ni/HfO2/Si-n+ RRAMs including quantum effects

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